The Microwave Journal Channel
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This panel of test/measurement and semiconductor experts covers topics such as on-wafer mmWave testing, low power/low cost approaches for IoT testing, RFFE module testing challenges, OTA testing, etc. and how they will play in the future of semiconductor testing. Experts from R&S, NI, Keysight,...
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National Instruments (and AWR)
National Instruments (and AWR) | Pages: 1 2 3