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Introducing the 2016 Advanced Low-Frequency Noise Analyzer

The new Advanced Low-Frequency Noise Analyzer Offers Unique Ability to Measure and Model Device Noise Across Wafers. This release features a new user interface and tight integration with Keysight's WaferPro Express software, a platform that performs automated wafer-level measurements of semiconductor devices.

Find out more information at http://www.keysight.com/find/eesof-a-lfna.
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