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Power semiconductor chip temperature dependency measurement

Temperature dependency characterization on a power MOSFET chip with a compact probe jig in a test fixture with thermal management equipment. (-50C to +250C) Check out the following URL for more information. http://www.keysight.com/en/pd-2404038-pn-B1506A/power-device-analyzer-for-circuit-design?cc=US&lc=eng
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